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Article

Interpretability of deep learning models for crop yield forecasting

D. Paudel ; A. de Wit ; H. Boogaard ; D. Marcos ; S. Osinga ; I.N. Athanasiadis |

Dans Computers and Electronics in Agriculture (vol. 206, March 2023)

Machine learning models for crop yield forecasting often rely on expert-designed features or predictors. The effectiveness and interpretability of these handcrafted features depends on the expertise of the people designing them. Neural networks [...]

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